Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers

Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers

by Scott Pardo
Released September 2013
Publisher(s): Chapman and Hall/CRC
ISBN: 9781466586895

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Book description

In engineering and quality control, various situations, including process validation and design verification, require equivalence and noninferiority tests. Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers presents methods for using validation and verification test data to demonstrate equivalence and noninferiority in engineering and applied science.

The book covers numerous tests drawn from the author’s more than 30 years of work in a range of industrial settings. It provides computational formulas for the tests, methods to determine or justify sample sizes, and formulas to calculate power and operating characteristic curves. The methods are accessible using standard statistical software and do not require complicated programming. The book also includes computer code and screen shots for SAS, R, and JMP.

This book provides you with a guide to performing validation and verification tests that demonstrate the adequacy of your process, system, or product. It will help you choose the best test for your application.

Table of contents

  1. Front Cover
  2. Contents
  3. Preface
  4. The Author
  5. Acknowledgments
  6. Introduction to Hypothesis Testing (1/4)
  7. Introduction to Hypothesis Testing (2/4)
  8. Introduction to Hypothesis Testing (3/4)
  9. Introduction to Hypothesis Testing (4/4)
  10. Chapter 1: Proportions and Binomial Random Variables (1/3)
  11. Chapter 1: Proportions and Binomial Random Variables (2/3)
  12. Chapter 1: Proportions and Binomial Random Variables (3/3)
  13. Chapter 2: Means (1/9)
  14. Chapter 2: Means (2/9)
  15. Chapter 2: Means (3/9)
  16. Chapter 2: Means (4/9)
  17. Chapter 2: Means (5/9)
  18. Chapter 2: Means (6/9)
  19. Chapter 2: Means (7/9)
  20. Chapter 2: Means (8/9)
  21. Chapter 2: Means (9/9)
  22. Chapter 3: Variances (Standard Deviations) and Coefficients of Variation (1/3)
  23. Chapter 3: Variances (Standard Deviations) and Coefficients of Variation (2/3)
  24. Chapter 3: Variances (Standard Deviations) and Coefficients of Variation (3/3)
  25. Chapter 4: Exponential Rate Parameters (1/2)
  26. Chapter 4: Exponential Rate Parameters (2/2)
  27. Chapter 5: Capability Indices (1/3)
  28. Chapter 5: Capability Indices (2/3)
  29. Chapter 5: Capability Indices (3/3)
  30. Chapter 6: Multivariate (1/2)
  31. Chapter 6: Multivariate (2/2)
  32. Chapter 7: Reliability (1/4)
  33. Chapter 7: Reliability (2/4)
  34. Chapter 7: Reliability (3/4)
  35. Chapter 7: Reliability (4/4)
  36. Chapter 8: Sample-Based Criteria (1/2)
  37. Chapter 8: Sample-Based Criteria (2/2)
  38. Chapter 9: Comparing Sequences of Points (1/3)
  39. Chapter 9: Comparing Sequences of Points (2/3)
  40. Chapter 9: Comparing Sequences of Points (3/3)
  41. Chapter 10: Calculating Sample Sizes
  42. Chapter 11: Computer Code—Power Curves (1/10)
  43. Chapter 11: Computer Code—Power Curves (2/10)
  44. Chapter 11: Computer Code—Power Curves (3/10)
  45. Chapter 11: Computer Code—Power Curves (4/10)
  46. Chapter 11: Computer Code—Power Curves (5/10)
  47. Chapter 11: Computer Code—Power Curves (6/10)
  48. Chapter 11: Computer Code—Power Curves (7/10)
  49. Chapter 11: Computer Code—Power Curves (8/10)
  50. Chapter 11: Computer Code—Power Curves (9/10)
  51. Chapter 11: Computer Code—Power Curves (10/10)
  52. References
  53. Appendix I: Review of Some Probability and Statistics Concepts (1/2)
  54. Appendix I: Review of Some Probability and Statistics Concepts (2/2)
  55. Appendix II
  56. Back Cover

Product information

  • Title: Equivalence and Noninferiority Tests for Quality, Manufacturing and Test Engineers
  • Author(s): Scott Pardo
  • Release date: September 2013
  • Publisher(s): Chapman and Hall/CRC
  • ISBN: 9781466586895