Material Notes and Tables
This chapter has been included to place material resistivity, density, and dielectric strength properties in one convenient place for ESD analysts. These lists contain spacecraft materials that might often be considered when doing penetrating electron-charging analyses, charge-accumulation analyses, and breakdown estimates. The lists are generally correct, but the reader should recheck the parameters, especially the resistivity and dielectric strength parameters, for any detail work.
The partial list of basic dielectric material properties in Table 6-1 is provided for illustration and reader convenience only. Data were taken from references [1,2] and other sources, including manufacturer data sheets. Some of the data may only be specified minimum or maximum limits and not typical values; actual resistivity values may differ by many orders of magnitude (e.g., FR4). Note that dielectric strength is always specified as a function of thickness and may be extrapolated to other thicknesses roughly as the inverse square root of the thickness. Each project must be responsible for compiling its own list based on the most current and relevant data. Reference  contains lists of dielectric properties for materials not included here. Other often-significant effects not tabulated here include temperature, radiation-induced conductivity, and electric field-induced conductivity.