14IEEE Std P1838: 3D Test Access Standard Under Development
Adam Cron1Erik Jan Marinissen2Sandeep K. Goel3Teresa McLaurin4 and Sandeep Bhatia5
1 Synopsys, 690 East Middlefield Road, Mountain View, CA, 94043, USA
2 IMEC, Kapeldreef 75, 3001 Leuven, Belgium
3 Taiwan Semiconductor Manufacturing Company Ltd., 2585 Junction Ave, San Jose, CA, 95134, USA
4 ARM, 5707 Southwest Parkway #100, Austin, TX, 78735, USA
5 Google, 1600 Amphitheatre Parkway, Mountain View, CA, 94043, USA
14.1 Introduction
Consumers of semiconductor products have, for decades, enjoyed the benefits of Moore's law [1], such as increased compute performance at decreased cost, due to the continuous scaling of process technology nodes. With feature sizes now reaching the range of single‐digit ...
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