Ultraviolet photoemission spectroscopy (UPS) for in situ characterization of thin film growth
K.M. Shen, Cornell University, USA
This chapter discusses the application of ultraviolet photoemission spectroscopy (UPS) and angle-resolved photoemission spectroscopy (ARPES) to study the electronic structure of thin films synthesized in situ using film growth techniques such as molecular beam epitaxy (MBE) and pulsed laser deposition (PLD). The chapter first describes the principles of photoemission spectroscopy and the current experimental state of this technique. Then, particular examples such as UPS and ARPES studies of in situ thin films of SrRuO3 and La1 − xSrxMnO3 are detailed.