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Integrated Circuit Design for Radiation Environments
book

Integrated Circuit Design for Radiation Environments

by Stephen J. Gaul, Nicolaas van Vonno, Steven H. Voldman, Wesley H. Morris
December 2019
Intermediate to advanced
392 pages
14h 5m
English
Wiley
Content preview from Integrated Circuit Design for Radiation Environments

5 Radiation Testing

5.1 Introduction

This chapter provides a brief introduction to the various radiation environments that may be encountered by electronic systems and components. We discuss ionizing radiation, single‐event effects (SEE) and proton effects, which are the three predominant natural space environments. We also briefly discuss man‐made environments found in nuclear weapons scenarios. We further discuss radiation testing in the laboratory for these environments and the simulation fidelity issues arising from these methodologies.

5.1.1 Radiation Units and Measurements

We will lead off with a short discussion of the units involved in radiation effects. As in many other disciplines, this field has a somewhat convoluted system of units, with a good mixture of SI and non‐SI units and of older and newer units, and we will restrict our comments to those in general use in radiation effects in electronics. Also, as in many disciplines, a good understanding of the units involved and of their relationships and derivation is essential to a clear understanding. We will discuss five categories of interest:

  1. 1. Radioactivity: the Curie, Becquerel, and Rutherford
  2. 2. Ionizing radiation exposure: the Röntgen
  3. 3. Absorbed ionizing radiation dose: the rad, Gray (Gy), and rem
  4. 4. Particle fluence and particle flux
  5. 5. Ionizing radiation dose equivalent: the Sievert

Activity is a measure of the radioactivity of a sample of a specific radioactive element or compound. A common ...

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Publisher Resources

ISBN: 9781119966340Purchase Link