Introduction to CMOS OP-AMPs and Comparators

INDEX

Acceptors, 18

ADC. see Analog-to-digital converter

A/D converter, see Analog-to-digital converter

Analog-to-digital converter (ADC):

basic principles, 255–263

differential nonlinearity (DNL), 261

gain error, 261

integral nonlinearity (1NL), 261

linear conversion range, 258

missing code error, 261

offset error, 260

quantization error, 258

signal to noise ratio (SNR), 260

white noise, 260

charge redistribution, 284

counting and tracking, 294–295

flash, 9, 263–270

integrating, 295–300

intermeshed ladder subranging, 278

interpolating flash, 257, 270–273

low-speed converters, 257

Nyquist rate converters, 257

over-sampling, 14

resistor-capacitor hybrid, 284

resistor-string circuit, 284

servo, 295

single-slope, 257

subranging, 274

successive approximation, 9, 257, 282–294

two-step flash, 273–282

Amplitude modulator, see Modulators

Analog systems, 1–2

Auto-zeroing comparator, 177–182

Band-gap reference voltage, 45

Bias circuits, 48–55

delta-VBE based, 53

supply independent, 50–53

temperature dependence, 53

threshold-based, 50

VBE-based, 51

Bode plot, 114

Body effect 29–30

Bubble errors in flash ADCs, 265

Built-in-voltage, 20

Bulk, 23

Cascode:

current source, 59

high-swing, 61

improved high-swing, 62

gain stage, 68

frequency response, 91

Channel, 23

Channel-length modulation, 25

Charge-mode DACs, 231–234

single-stage, 231

two-stage, 233

Charge redistribution ADCs, 290–291

Clock-feed through, 140, 183, 268

Clock period, 3

CMFB, see Common mode feedback

CMOS:

differential stage with ...