Optical metrology utilizes a large number of techniques for the measurement. This chapter introduces these techniques. These are whole-field techniques and include (1) holography and hologram interferometry, (2) speckle photography and speckle interferometry, (3) moiré interferometry, (4) photoelasticity, and (5) microscopy. All these techniques are extensively used in deformation studies, vibration analysis, and surface topography. The basic principles and variants of these techniques are discussed in this chapter and their applications will follow in later chapters.
5.1 HOLOGRAPHY AND HOLOGRAM INTERFEROMETRY
Birth of holography rests due to a technological demand of improving the resolution of electron microscope. The resolution ...
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