
140 Ionizing Radiation Effects in Electronics
occurrence at any time, but nite duration. Thus, the longer the clock period, the less
likelihood that a SET is captured by a linear rate. Consequently, for SET-sensitive
devices, the failure rate is reduced with a longer clock period.
There are a couple of reasons why frequency dependence is not often studied
when examining the SEE sensitivity of a microprocessor. The rst is that at low
frequency the probability is already at about 20%–30% of maximum so it cannot
increase much before saturating. Additionally, frequency-dependent upsets are
mixed with those that are not frequency-dependent and possib ...