Book description
Quality and Process Methods describes tools for evaluating and improving processes. The book begins by discussing creating control charts, which let you visualize process measurements over time, quantify common cause variation, and identify special cause variation. Details about estimating your process capability based on measurement systems analysis studies are included. Lastly, the book discusses Pareto plots and cause-and-effect diagrams to identify root causes of variability.
Table of contents
- Contents
- Learn about JMP
- Introduction to Quality and Process Methods
-
Control Chart Builder
- Create Control Charts Interactively
- Overview of Control Chart Builder
- Example of the Control Chart Builder
- Control Chart Types
- Launch the Control Chart Builder
- Control Chart Builder Window
- Control Chart Builder Options
- Saving and Retrieving Limits
- Excluded and Hidden Samples
- Additional Examples of the Control Chart Builder
-
Statistical Details for the Control Chart Platform
- Control Limits for - and R-charts
- Control Limits for - and S-charts
- Control Limits for Individual Measurement and Moving Range Charts
- Control Limits for p- and np-charts
- Control Limits for u-charts
- Control Limits for c-charts
- Levey-Jennings Charts
- Control Limits for g-charts
- Control Limits for t-charts
-
Shewhart Control Charts
- Create Variable and Attribute Control Charts
- Overview of the Control Chart Platform
- Example of the Control Chart Platform
- Shewhart Control Chart Types
- Launch the Control Chart Platform
- The Control Chart Report
- Control Chart Platform Options
- Saving and Retrieving Limits
- Excluded, Hidden, and Deleted Samples
- Additional Examples of the Control Chart Platform
-
Statistical Details for the Control Chart Platform
- Control Limits for - and R-charts
- Control Limits for - and S-charts
- Control Limits for Individual Measurement, Moving Range, and Median Moving Range Charts
- Control Limits for UWMA Charts
- Control Limits for EWMA Charts
- Control Limits for p- and np-charts
- Control Limits on u-charts
- Control Limits on c-charts
- Levey-Jennings Charts
- Cumulative Sum Control Charts
-
Multivariate Control Charts
- Monitor Multiple Process Characteristics Simultaneously
- Multivariate Control Chart Overview
- Example of a Multivariate Control Chart
- Launch the Multivariate Control Chart Platform
- The Multivariate Control Chart
- Multivariate Control Chart Platform Options
- Additional Examples of Multivariate Control Charts
- Statistical Details for Multivariate Control Charts
-
Measurement Systems Analysis
- Evaluate a Continuous Measurement Process Using the EMP Method
- Overview of Measurement Systems Analysis
- Example of Measurement Systems Analysis
- Launch the Measurement Systems Analysis Platform
- Measurement Systems Analysis Platform Options
- Additional Example of Measurement Systems Analysis
- Statistical Details for Measurement Systems Analysis
-
Variability Gauge Charts
- Evaluate a Continuous Measurement Process Using Gauge R&R
- Overview of Variability Charts
- Example of a Variability Chart
- Launch the Variability/Attribute Gauge Chart Platform
- The Variability Gauge Chart
- Variability Gauge Platform Options
- Additional Examples of Variability Charts
- Statistical Details for Variability Charts
-
Attribute Gauge Charts
- Evaluate a Categorical Measurement Process Using Agreement Measures
- Attribute Gauge Charts Overview
- Example of an Attribute Gauge Chart
- Launch the Variability/Attribute Gauge Chart Platform
- The Attribute Gauge Chart and Reports
- Attribute Gauge Platform Options
- Statistical Details for Attribute Gauge Charts
- Capability Analysis
- Pareto Plots
- Cause-and-Effect Diagrams
- References
- Index
Product information
- Title: JMP 11 Quality and Process Methods
- Author(s):
- Release date: September 2013
- Publisher(s): SAS Institute
- ISBN: 9781612906744
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