Nanoelectronic Device Applications Handbook

45	Optimized Built-In Self-Test Technique for CAEN-Based Nanofabric Systems Maciej Zawodniok and Sambhav Kundaikar

CONTENTS

45.1  Introduction

45.1.1  Benefits and Challenges of Nanotechnology

45.2  Background and Related Works

45.2.1  Novel Logic Mapping Technique

45.3  Testing Approach

45.3.1  Overview

45.3.2  Test Architectures and Procedure

45.3.3  Testing Procedure

45.3.4  Algorithm for Locating Defects and Example Defect Detection

45.3.5  Example of a Faulty Block Identification

45.3.6  Design of New BUT Configurations and Test Patterns and Fault Coverage Analysis

45.3.7  Configuration C1: Stuck-at-0  and Stuck-Open Faults

45.3.8  Configuration C2: Stuck-at-1  Faults

45.3.9  Configuration C3: AND/OR Bridging Faults (h/h)

45.3.10  Configuration ...