305
8
Quantum Transport in Carbon-Based Devices
High elds tend to reorient carrier moments and velocity vectors under the
inuence of a high electric eld. In this chapter, we explore the modica-
tion in the NEADF because of linear energy–momentum relationship preva-
lent in all carbon-based devices. Ballistic transport comes into play when
the channel length is below the scattering-limited mfp. Quantum effects are
natural ingredients of ballistic nonequilibrium in all carbon-based devices.
8.1 High-Field Graphene Transport
In the presence of an electric eld E, as discussed in Chapter 4, the isotro-
pic equilibrium carrier statistics based on the FD distribution transforms
into anisotropic NEADF given by [1,2]
fE
e
e
EE qkT
xH
FB
(,,)
(( ))/
()
E
E
θ
θ
=
+
=
+
−−
1
1
1
1
(8.1)
with
H
EE
kT
o
Fco
B
() ,θηδθ
ηθ
π=−
≤≤ cos , =
02
(8.2)
x
EE
kT
kT
q
V
V
kT
q
co
B
o
co
co
Bt
o
t
B
=
==
==
,, ,δ
E
E
E

(8.3)
NEADF of Equation 8.1 is highly asymmetric that favors electrons with veloc-
ity vectors antiparallel to the electric eld as compared to those with velocity
vectors parallel to the electric eld. NEADF transforms randomly oriented
velocity vectors or mfps or electric dipoles q into unidirectional ones, yielding
the high-eld saturation velocity equal to v
Fo
in the absence of a quantum emis-
sion [2]. The relative drift velocity v
D
/v
Fo
, as will be shown, is a linear function
of the electric eld below δ
o
= 1 corresponding to the critical electric eld
EE=
co
and is sublinear as the electric eld E > E
co
rises, resulting in saturation for
higher values of the electric eld with
δ
o
1
. The thermal voltage V
t
and ohmic
(o) long-channel LC () mfp
o
in E
co
play prominent roles in this transition [3].
306 Nanoelectronics
NEADF is endowed with a clear voyage from drift diffusion to the ballistic
regime consistent with Buttiker’s paradigm [4,5] with each mfp and resistors
of average length
o
. The ends of the mfp resistor are virtual thermalizing
probes, one end being higher than the other end in the Fermi level (elec-
trochemical potential) by
q
o
E . Within this scenario, carriers are removed
from the device and injected into a virtual reservoir where they are thermal-
ized and reinjected into the ballistic channel of length
o
. The description is
also consistent with the Natori model [6] of ballistic transport in the ballistic
domain by the Fermi level of the contacts in a MOSFET. In fact, Mugnaini and
Iannaccone [7,8] validate this model by applying it to a nanoscale MOSFET.
Similarly, CNT and several of its variations in the form of graphene sheets
and ribbons are nding a wide variety of applications in monitoring the
environment, sensing chemical elements, developing new indigenous mate-
rials, and providing interconnects for a variety of biochips. This chapter will
open vista for all specialties as NEADF covers a wide range of degeneracy,
phonon emission, and the electric eld, consistent with experimental obser-
vations. The results can be easily converted to obtain current–voltage char-
acteristics as indicated in References 9 and 10.
The drift response v
D
to an applied electric eld is the average of v
FO
cos θ
using the NEADF and DOS, resulting in
v
vu
dH
D
Fo g
=
1
2
1
0
2
π
θθ θ
π
co
s(()
)
(8.4)
The reduced Fermi energy η is now a function of the electric eld and is
evaluated from the normalization condition for carrier concentration n
g
udHu
n
N
gg
g
g
=
ℑ=
1
2
1
0
2
π
θθ
π
(()),
(8.5)
The effective density of states N
g
is given by Equation 3.79. The normalized
drift velocity v
D
/v
Fo
as a function of the normalized electric eld δ
o
= E/E
co
is
shown in Figure 8.1 for u
g
= 1, 5, and 10. Three sets of curves almost overlap.
The dashed lines, barely visible in the high-eld domain, are from Equation
8.4. A simplied version of Equation 8.4 is obtained by substitution of cos
θ = ±1/2 in H(θ) as distribution is split into the ±x-direction. θ = −π/2 to + π/2
is for the +x-direction and θ = /2 to + 3π/2 is for the –x-direction. cos θ〉 = ±1/d
is for an arbitrary dimensionality d = 3, 2, and 1 [2,11]. The squares in Figure
8.1 are obtained when this approximation is applied, indicating the anisotro-
pic character of carrier distribution. The solid lines are variations of Equation
8.5 as delineated below.
An enhanced perspective of this anisotropy is obtained when Δn
g
/n
g
is also plotted in Figure 8.1, as shown by solid lines. Δn
g
= n
g+
n
g
is the

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