CONTENTS
13.1 Evaluating TSV-to-Device Noise
13.1.1.1 Modeling the TSV MOS-C
13.1.1.2 Substrate Coupling Extraction
13.1.1.3 FinFET and Planar Transistor Modeling
13.1.2 TSV Noise-Coupling Comparison: FinFET vs. Planar Transistors
13.2 TSV-to-Device Noise-Mitigation Techniques
13.2.2 Noise Mitigation Techniques
13.2.2.1 Thicker Dielectric Liner
13.2.2.2 Backside Ground Plane
13.2.3 Comparison of Noise-Mitigation Techniques
ABSTRACT
Since 1965, integrated circuit (IC) complexity ...
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