October 2010
Intermediate to advanced
416 pages
10h 31m
English
book
Power Integrity for I/O Interfaces: With Signal Integrity/Power Integrity Co-Design
by Vishram S. Pandit, Woong Hwan Ryu, Myoung Joon Choi
Content preview from Power Integrity for I/O Interfaces: With Signal Integrity/Power Integrity Co-Design
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Chapter 9. Measurement Techniques
This chapter addresses frequency domain and time domain measurement techniques for power integrity and signal integrity. The measurement of S-parameters constitutes a vital component of power/signal integrity design verification for high-speed I/O interfaces. Typically, S-parameters are measured with a Vector Network Analyzer (VNA) that calculates input/output reflections and transmission by sequentially applying signals at various frequencies and recording the response of the Device Under Test (DUT). The resulting data depicts a set of measured values as a function of frequency. On the other hand, an oscilloscope, a measurement instrument used for Power Delivery Network (PDN) noise measurements and signal jitter ...
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