December 2012
Intermediate to advanced
600 pages
19h 35m
English
2. Factors Affecting Carrier Recombination
3. Measurement of the Minority-Carrier Lifetime
3.2. Interpretation of Effective Lifetime Measurements
3.2.1. Surface Recombination Velocity
3.2.2. Emitter Saturation Current Density
3.3. Lifetime Measurements in Silicon Ingots
3.4. Lifetime Instabilities and Measurement Artifacts
3.4.1. Lifetime Changes in Boron-Doped CZ Silicon and Iron-Contaminated Silicon
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