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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by Eishi H. Ibe

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About the Author

Dr. Eishi Hidefumi IBE received his BS degree in Physics from Kyoto University, Japan in 1975, and his PhD degree in Nuclear Engineering from Osaka University, Japan in 1985.

He has joined the Atomic Energy Research Laboratory, Hitachi Ltd in 1975. He was promoted to chief researcher in the Yokohama Research Laboratory (formerly Production Engineering Research Laboratory), Hitachi Ltd. in 2006.

He has made outstanding accomplishments in nuclear engineering during the first 20 years of his career, in particular radiation effects on water (radiolysis) and component materials, and in single event effects on semiconductor devices during the last 18 years. His expertise covers very wide areas of sciences, such as elementary particle/cosmic ray physics, nuclear/neutron physics, semiconductor physics, mathematics and computing technologies, ion-implantation/mixing and accelerator technologies, electro-chemistry, database handling, RBS (Rutherford Backscattering Spectrometry)/Auger/SEM (Scanning Electron Microscopy)/Laser-beam micro analysis, and so on.

He has carried out pioneering work on simulation techniques of water radiolysis in the coolant of nuclear power plants to reveal that water coolant in the core decomposes into H2 and H2O2. He has also established a theoretical basis for the hydrogen water chemistry techniques used to suppress oxidising H2O2, which is now widely applied to Japanese boiling water reactors to mitigate inter-granular stress corrosion cracking ...

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