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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by Eishi H. Ibe

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Acronyms

ACEArchitectural Correct Execution
ALLSAligned Laboratory System
ALPENALpha Particle source/drain PENtration
ALSAbsolute Laboratory System
ALUArithmetic-Logic Unit
AMUSEAutonomous MUltilevel emulation system for Soft Error evaluation
ANITAAtmospheric-like Neutrons from thIck TArget
AOIArea Of Interest
ASICApplication Specific Integrated Circuit
ASILAutomotive Safety Integrity Level
ASTEPAltitude Single event effects Test European Platform
AVFArchitectural Vulnerability Factor
AVPArchitectural Verification Program
BANBody Area Network
BCDMRBistable Cross-coupled Dual Modular Redundancy
BICSBuilt-In Current Sensor
BISERBuilt-In Soft Error Resilience
BIPSBuilt-in Pulse Sensor
BISTBuilt-In Self Test
BLBit Line
BNLBrookhaven National Laboratory
BOXBuried Oxide
BPSGBoron Phosphor Silicate Glass
BUTBoard Under Test
CAMContent Addressable Memory
CANController Area Network
CCDCharge Coupled Device
CHBCHecker Board
CHBcCHecker Board complement
CLConfidence Level
CLRCross-Layer Reliability
CMCenter of Mass
CMOSComplementary Metal Oxide Semiconductor
CMPChemical Mechanical Polishing
CNLUC Davis Crocker Nuclear Laboratory
CNRFCold Neutron Research Facility
CORIMSCOsmic Radiation IMpact Simulator
CPUCentral Processing Unit
CRAMConfiguration Random Access Memory
CRCCyclic Redundancy Code
CYCLONCyclotron of Louvain la Neuve
CYRICCYclotron and RadioIsotope Center
DCCDuplication + Comparison + Checkpointing
DFDerating Factor
DICEDual Interlocked storage CEll
DLLDelay Locked Loop
DMR ...

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