The Electrical Engineering Handbook

7

Noise Analysis and Design in Deep Submicron Technology

Mohamed Elgamel and Magdy Bayoumi,     The Center for Advanced Computer Studies, University of Louisiana at Lafayette, Lafayette, Louisiana, USA

7.1. Introduction

7.1.1. Noise

7.1.2. Reliability

7.2. Noise Sources

7.2.1. Interconnect Crosscapacitance Noise

7.2.2. Charge Sharing Noise

7.2.3. Charge Leakage Noise

7.2.4. Power Supply Noise

7.2.5. Mutual Inductance Noise

7.2.6. Thermal Effects

7.2.7. Process Variation

7.3. Noise Reduction Techniques

7.3.1. Signal Encoding Techniques

7.3.2. Circuit Techniques

7.4. Noise Analysis Algorithms

7.4.1. Small-Signal Unity Gain Failure Criteria

7.4.2. Intel Failure Criteria

7.4.3. Design Flow

Acknowledgments

References

7.1 Introduction ...