In this chapter, we consider defects, something near and dear to us testers. Remember, in IEEE terms, an incident is found, and after research, we may conclude it’s a defect. As an advanced test analyst, you will have already done that research by the time you are documenting it, so instead of calling this incident management, we’re calling it defect management because that’s what we’re really doing.
Terms used in this chapter
anomaly, configuration control board, defect, error, failure, incident, incident logging, priority, root cause analysis, severity
Both the test analyst and the technical test analyst are interested in accurately recording issues found in their areas. A test analyst will tend to approach ...