Surface topography
P. Sahoo, Jadavpur University, India
Abstract:
This chapter discusses the approaches to solid surface topography characterization including the surface layers, roughness parameters and statistical aspects. The multiscale characterization of surface topography in terms of fractal analysis, Fourier transform and wavelet transformation is also considered. The measurement techniques for surface roughness evaluation are discussed in terms of surface profilometry, optical methods and electron microscopy including the advanced techniques like scanning tunnelling microscopy and atomic force microscopy.
Keywords
surface layers
roughness parameters
multiscale characterization
measurement techniques
1.1 Introduction
Surface ...
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