Analysis and synthesis of frequency-diverse ultrasonic flaw-detection systems using order statistics and neural network processors
J. Saniie and E. Oruklu, Illinois Institute of Technology, USA
Abstract:
Ultrasonic imaging is used for nondestructive evaluation of materials and flaw detection. Flaw detection in the presence of microstructure scattering noise is a challenging problem. Frequency-diverse ultrasonic detection algorithms decorrelate the microstructure scattering noise and enhance the visibility of echoes associated with defects. The performance of ranked order-statistic processors is examined using both theory and ultrasonic experiments. Split-spectrum processing combined with neural networks as post-processors can improve ...
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