VLSI and Hardware Implementations using Modern Machine Learning Methods

6 Online Test Derived from Binary Neural Network for Critical Autonomous Automotive Hardware

Dr. Philemon Daniel

Assistant Professor, NIT Hamirpur, Hamirpur, Himachal Pradesh, India

1. CONTENTS
2. 6.1 Autonomous Vehicles
3. 6.1.1 Levels of Autonomy
4. 6.1.2 Safety Concerns
5. 6.2 Traditional VLSI Testing
6. 6.3 Functional Safety
7. 6.3.1 Fault Detection Time Interval
8. 6.4 Discussion 1: Binary Convolutional Neural Network
9. 6.4.1 One Layer of the Convolutional Network
10. 6.4.2 Forward Propagation
11. 6.4.3 Binary Neural Autoencoder Model with Convolutional 1D
12. 6.4.4 Binary Neural Network Model with Convolutional 2D
13. 6.4.5 Backward Propagation
14. 6.5 Discussion 2: On-Chip Compaction
15. 6.5.1 Binary Recurrent Neural Networks
16. 6.5.2 Forward Propagation
17. 6.5.3 Backpropagation
18. 6.5.4