R2.0—Books
[bib02sec01_001] [Abramovici 1994] M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design, IEEE Press, Piscataway, NJ, 1994.
[bib02sec01_002] [Bushnell 2000] M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Springer Science, New York, 2000.
[bib02sec01_003] [Crouch 1999] A. Crouch, Design for Test for Digital IC’s and Embedded Core Systems, Prentice Hall, Upper Saddle River, NJ, 1999.
[bib02sec01_004] [Fujiwara 1985] H. Fujiwara, Logic Testing and Design for Testability, The MIT Press, Cambridge, MA, 1985.
[bib02sec01_005] [IEEE 1463-2001] IEEE Standard Description Language Based on the Verilog Hardware Description Language, IEEE ...
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