R8.1—Introduction
[bib08_001] [Wu 1998] C.-W. Wu, Testing embedded memories: is BIST the ultimate solution?, in Proc. Asian Test Symp., November 1998, pp. 516–517.
R8.2—RAM Functional Fault Models and Test Algorithms
[bib08_002] [Dekker 1988a] R. Dekker, F. Beenker, and L. Thijssen, Fault modeling and test algorithm development for static random access memories, in Proc. IEEE Int. Test Conf., October 1988, pp. 343–352.
[bib08_003] [Huang 1999] C.-T. Huang, J.-R. Huang, C.-F. Wu, C.-W. Wu, and T.-Y. Chang, A programmable BIST core for embedded DRAM, IEEE Des. Test Comput., 16(1), 59–70, 1999.
[bib08_004] [Nadeau-Dostie 1990] B. Nadeau-Dostie, A. Silburt, and V. K. Agarwal, Serial interface for embedded-memory testing, IEEE Des. Test Comput., 7(2), ...
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