Chapter 6. Test Compression
Xiaowei LiChinese Academy of Sciences, Beijing, China
Kuen-Jong LeeNational Cheng Kung University, Tainan, Taiwan
Nur A. ToubaUniversity of Texas, Austin, Texas
About this Chapter
Test compression involves compressing the amount of test data (both stimulus and response) that must be stored on automatic test equipment (ATE) for testing with a deterministic (automatic test pattern generation [ATPG]-generated) test set. This is done by adding some additional on-chip hardware before the scan chains to decompress the test stimulus coming from the ATE and after the scan chains to compress the response going to the ATE. This differs from built-in self-test (BIST) and hybrid BIST in that the test vectors that are applied to the ...
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