Chapter 9. Memory Diagnosis and Built-In Self-Repair
Cheng-Wen WuNational Tsing Hua University, Hsinchu, Taiwan
About this Chapter
The purpose of memory diagnosis is twofold: (1) locating failures and subsequently repairing them, and (2) analyzing failures and defects and subsequently improving design and process. Both are important for enhancing manufacturing yield.
In this chapter we first present a hybrid BIST design—with diagnosis support— for embedded RAM. In association with the BIST design, we also will show a diagnosis system (called MECA) for automatic identification of the fault site and fault type. The BIST design has a test mode that supports fault location for subsequent laser repair or self-repair and an online programming mode for ...
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