Chapter 10. Boundary Scan and Core-Based Testing
Kuen-Jong Lee
National Cheng Kung University, Tainan, Taiwan
About this Chapter
Boundary scan, also known as the IEEE 1149.1 or JTAG standard, appears to be the most successful test standard ever approved by the IEEE. Initially targeting board-level testing for digital circuits, this standard has now been adopted by industry for use in most large IC chips and has been used to access many other applications, including power management, clock control, debugging, verification, and chip reconfiguration. An extended boundary-scan standard for the I/O protocol of high-speed networks (namely, 1149.6) has recently been established, and it further enhances the applicability of boundary scan.
Core-based test ...
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