GLOSSARY
ABM: Adams-Bashforth-Moulton
AC: alternating current
AMD: average minimum degree
BBD: bordered block diagonal
BDF: backward differentiation formula
BDF2: second order BDF
BE: backward Euler
BJT: bipolar junction transistor
BS: backward substitution
BTF: block-triangular form
CCCS: current-controlled current source
CCS: controlled current source
CCVS: current-controlled voltage source
COLAMD: column average minimum degree
COLMMD: column multiple minimum degree
CVS: controlled voltage source
DAE: differential-algebraic equation
DC: direct current
DCCS: dynamic controlled current source
DCVS: dynamic controlled voltage source
DRAM: dynamic random access memory
ERO: elementary row operation
FE: forward elimination
FE: forward Euler
FET: field-effect transistor
FS: forward substitution
GE: Gaussian elimination
GEPP: GE with partial pivoting
GE/LU: shorthand, refers to both LU factorization and GE when implemented as in Gauss's method for LU factorization.
GJ: Gauss-Jacobi
GS: Gauss-Seidel
GTE: global truncation error
IEEE: institute of electrical and electronics engineers
IVP: initial value problem
KCL: Kirchoff's current law
KLU: “Clark Kent” LU factorization
KVL: Kirchoff's voltage law
LMS: linear multistep
LTE: local truncation error
MD: minimum degree
MMD: multiple minimum degree
MNA: modified nodal analysis
MOSFET: metal-oxide-semiconductor field-effect transistor
MTE: ...
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