Electronic Design Automation

3.5.1.2. Broadcast-scan-based schemes

Another class of test stimulus compression schemes is based on broadcasting the same value to multiple scan chains. This was first proposed in [Lee 1998] and [Lee 1999]. Because of its simplicity and effectiveness, this method has been used as the basis of many test compression architectures, including some commercial design for testability (DFT) tools.

3.5.1.2.1. Broadcast scan

To illustrate the basic concept of broadcast scan, first consider two independent circuits C¹ and C². Assume that these two circuits have their own test sets T¹ = t¹¹,t¹², …, t^1k > and T² = < t²¹, t²², …, t²¹ >, respectively. In general, a test set may consist of random patterns and deterministic patterns. In the beginning of ...