6
Test Generation from Combinatorial Designs
CONTENTS
6.2 A combinatorial test design process
6.5 Mutually orthogonal latin squares
6.6 Pairwise design: binary factors
6.7 Pairwise design: multi-valued factors
6.9 Covering and mixed-level covering arrays
The purpose of this chapter is to introduce techniques for the generation of test configurations and test data using the combinatorial design techniques with program inputs and their values as factors and levels respectively. These techniques are useful when testing a variety of applications. They allow selection of a small set of test configurations ...
Get Foundations of Software Testing, 2nd Edition now with the O’Reilly learning platform.
O’Reilly members experience books, live events, courses curated by job role, and more from O’Reilly and nearly 200 top publishers.