E
E-SEM, See Environmental SEM
Early-life reliability prediction, 238
EBIC, See Electron beam-induced current
EBT, See Electron beam testing
ECL, See Emitter-coupled logic
Edge dislocation, 121–122
Edge-emitting diodes (EED), 88–89
EDX analysis, See Energy-dispersive X-ray analysis
EELS, See Electron energy loss spectroscopy
Effective diffusivity, 253
EL, See Electroluminescence
Elastic strain/plastic strain, 538–540
Electric field acceleration factors, 349–350
Electric field-induced metal migration, 267
Electrical connectors
Electrical contacts, 505
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