Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices

Chapter 6

Diode laser reliability engineering program

6.1 Reliability test plan

6.1.1 Main purpose; motivation; and goals

6.1.2 Up-front requirements and activities

6.1.3 Relevant parameters for long-term stability and reliability

6.1.4 Test preparations and operation

6.1.5 Overview of reliability program building blocks

6.1.6 Development tests

6.1.7 Manufacturing tests

6.2 Reliability growth program

6.3 Reliability benefits and costs

6.3.1 Types of benefit

6.3.2 Reliability–cost tradeoffs

References

Introduction

The main part of this chapter is dedicated to the detailed description of a typical laser reliability test program required for achieving qualification of a diode laser product. In the first part, some up-front activities are addressed, which are required to implement an efficient reliability engineering program. These include fostering a culture of reliability in the organization, the definition of reliability specifications, and product failures. A crucial necessity is also to conduct a risk assessment by implementing a failure modes and effect analysis program at the beginning of the product design. Critical laser parameters for long-term stability and reliability will be determined. Essential for successful reliability investigations are the test preparations, which include procuring effective test equipment and defining sample sizes, and test durations of the experiments. The central portion of this chapter deals extensively with the technical aspects of the individual ...