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6.2 The Need for Alternative Methods
6.3 Probabilistic Delay Fault Model and Output Deviations for SDDs
6.3.1 Method of Output Deviations
126.96.36.199 Gate Delay Defect Probabilities
188.8.131.52 Propagation of Signal Transition Probabilities
184.108.40.206 Implementation of Algorithm for Propagating Signal Transition Probabilities
220.127.116.11 Pattern-Selection Method
6.3.2 Practical Aspects and Adaptation to Industrial Circuits
6.3.3 Comparison to SSTA-Based Techniques
6.4 Simulation Results
6.4.1 Experimental Setup and Benchmarks
6.4.2 Simulation Results
6.4.3 Comparison of the Original Method to the Modified Method
Very deep-submicron ...