Sampling Patterns Optimized for Uniform Distribution of Edges
A. Cross Robert, Indiana University Bloomington, Indiana. E-mail address: rcross@cs.indiana.edu
Introduction
This gem examines the results of an automated gradient search of optimized sampling patterns. The intent is to find a set of samples that perform better than other sampling patterns, yet require no evaluation as they are precomputed.
The present approach extends methods described in a previous gem (Chiu et al. 1994) whose introduction is restated below:
Monte-Carlo integration is often used to compute pixel values. For every pixel, a set of sample points is generated. The radiances of each point are then computed and averaged. To avoid aliasing, the sample points ...
Get Graphics Gems V (IBM Version) now with the O’Reilly learning platform.
O’Reilly members experience books, live events, courses curated by job role, and more from O’Reilly and nearly 200 top publishers.