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Patterns in the Machine: A Software Engineering Guide to Embedded Development
book

Patterns in the Machine: A Software Engineering Guide to Embedded Development

by John T. Taylor, Wayne T. Taylor
January 2021
Intermediate to advanced
300 pages
6h 26m
English
Apress
Content preview from Patterns in the Machine: A Software Engineering Guide to Embedded Development
© John T. Taylor, Wayne T. Taylor 2021
J. T. Taylor, W. T. TaylorPatterns in the Machinehttps://doi.org/10.1007/978-1-4842-6440-9_6

6. Unit Testing

John T. Taylor1   and Wayne T. Taylor2
(1)
Covington, GA, USA
(2)
Golden, CO, USA
 

PIM defines a unit test as demonstrable evidence that an individual module works in isolation and that it meets all requirements and the design criteria. In this context, an “individual module” means a header file (.h) and its corresponding implementation file (.c or .cpp). If you’re programming in C++, this means that essentially every class will require a corresponding unit test. In C, most of your functions will require unit tests.

I know this can sound overwhelming. If you have to write a unit test for every class, it seems ...

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ISBN: 9781484264409Purchase LinkPublisher Website