Signal Integrity and Radiated Emission of High-Speed Digital Systems

Contents

List of Examples

Foreword

Preface

1 Introduction to Signal Integrity and Radiated Emission in a Digital System

1.1 Power and Signal Integrity

1.1.1 Power Distribution Network

1.1.2 Signal Distribution Network

1.1.3 Noise Limitations and Design for Characteristic Impedance

1.2 Radiated Emission

1.2.1 Definition of Radiated Emission Sources

1.2.2 Radiated Emission Standards

1.2.3 Radiated Emission from a Real System

1.3 Signaling and Logic Devices

1.3.1 Overshoot, Undershoot and Plateau

1.3.2 Noise Immunity

1.3.3 Timing Parameters

1.3.4 Eye Diagram

1.4 Modeling Digital Systems

1.4.1 Mathematical Tools

1.4.2 Spice-Like Circuit Simulators

1.4.3 Full-Wave Numerical Tools

1.4.4 Professional Simulators

References

2 High-Speed Digital Devices

2.1 Input/Output Static Characteristic

2.1.1 Current and Voltage Specifications

2.1.2 Transistor–Transistor Logic (TTL) Devices

2.1.3 Complementary Metal Oxide Semiconductor (CMOS) Devices

2.1.4 Emitter-Coupled Logic (ECL) Devices

2.1.5 Low-Voltage Differential Signal (LVDS) Devices

2.1.6 Logic Devices Powered and the Logic Level

2.2 Dynamic Characteristics: Gate Delay and Rise and Fall Times

2.3 Driver and Receiver Modeling

2.3.1 Types of Driver Model

2.3.2 Driver Switching Currents Path

2.3.3 Driver Non-Linear Behavioral Model

2.3.4 Receiver Non-Linear Behavioral Modeling

2.4 I/O Buffer Information Specification (IBIS) Models

2.4.1 Structure of an IBIS Model

2.4.2 IBIS Models and Spice

References

3 Inductance

3.1 Loop Inductance

3.1.1 Inductances ...