Signal Integrity and Radiated Emission of High-Speed Digital Systems
by Spartaco Caniggia, Francescaromana Maradei
List of Examples
Example 5.1: Measurements and Graphical Method Applied to an Interconnection with TTL Devices
Example 6.1: Point-to-Point Structure
Example 6.3: Two Coupled Lines with Linear Loads
Example 6.4: Two Coupled Traces with TTL Devices in a Point-to-Point Test Board Structure
Example 6.5: Two Coupled Lines in a Bus Test Board Structure
Example 6.6: Five Coupled Lines with Non-linear Loads
Example 7.1: Trace with 50 Ω Characteristic Impedance
Example 7.2: Signal Integrity in a Lossy Coaxial Cable
Example 7.3: Signal Integrity in a Lossy UTP Cable
Example 7.4: Eye Diagram of a 75m Unshielded Twisted-pair Cable Driven by an RS422 Device
Example 8.1: Switching Noise Simulations of Two Stripline and Microstrip Structures
Example 8.2: Test Board for Prediction of Power Bus Impedance by Several Methods
Example 8.3: Measurements and Simulations with Standard Buried Capacitance (SBC) Test Boards
Example 9.1: Computations and Measurements of a Clock Spectrum
Example 9.2: Calculations and Measurements of Emission Produced by P-Test Boards
Example 9.3: Calculations and Measurements of Emission from S-Test Boards
Example 9.4: Calculations and Measurements of Emission from A-Test Boards
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