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Materials Processing by Cluster Ion Beams
book

Materials Processing by Cluster Ion Beams

by Isao Yamada
August 2015
Intermediate to advanced
260 pages
6h 51m
English
CRC Press
Content preview from Materials Processing by Cluster Ion Beams
205Applications
factor. Figure9.8 shows (a) the structure of a poly- Si TFT and
(b) a scanning electron microscope (SEM) image of the layers
of poly- Si, gate insulator, and gate electrode lms after laser
annealing. The hillock formation in the Si layer can be seen [6].
Figure9.9 shows example AFM images from a poly- Si lm
surface (a) after laser crystallization and (b) after Ar- GCIB
irradiation at 20 kV and 1 × 10
16
ions/ cm
2
[7]. By selecting
cluster source materials, irradiation energy, combinations of
different source materials, and glancing- angle irradiation pro-
cessing, surface smoothing by GCIB has effectively eliminated
the hil ...
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Publisher Resources

ISBN: 9781498711760