C
C-AM, 620
C-SCAN mode, 620
C-V curves, 151
Cable-jacket defects, 593–594
Capacitance–voltage characteristics (C–V characteristics), 67–68
Capacitive coupling voltage contrast (CCVC), 650
Capacitor failures, 206
Capillarity theory, 281–282
Capillary
action, 583
adhesion, 153–154
force, 156–158
Card edge connector, 512–513
Carrier mobility, 124, 687–688
Catastrophic optical damage (COD), 575–576
Catastrophic-degradation mode, 571–573
Cathodoluminescence (CL), 632–634
Cavitation
bubbles, 158–159
effects, 299–300
Cd-plated screw fasteners, 141
Central limit theorem, ...

Get Reliability and Failure of Electronic Materials and Devices, 2nd Edition now with O’Reilly online learning.

O’Reilly members experience live online training, plus books, videos, and digital content from 200+ publishers.