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Developments in Surface Contamination and Cleaning, Volume 7
book

Developments in Surface Contamination and Cleaning, Volume 7

by Rajiv Kohli, Kashmiri L. Mittal
November 2014
Intermediate to advanced
206 pages
6h 12m
English
William Andrew
Content preview from Developments in Surface Contamination and Cleaning, Volume 7
Chapter 2

Mid-IR Spectroscopy as a Tool for Cleanliness Validation

Mary A. Thomson    Remspec Corporation, Sturbridge, Massachusetts, USA

Abstract

Mid-infrared spectroscopy performed in the reflectance mode provides a convenient tool for surface analysis and cleanliness validation. The method can be used to identify and measure organic contaminants down to submicrogram levels and provide a direct, near real-time result without the need for subsequent laboratory analysis. The method is described in detail, and a number of laboratory-based examples and field studies are discussed.

Keywords

Mid-infrared

Spectroscopy

Infrared reflection-absorption spectroscopy

Cleanliness validation

Contamination

Grazing angle

Direct reflectance

Fourier transform infrared

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Publisher Resources

ISBN: 9780323313032