
Test Generation from Finite-State Models
SUMMARY
The area of test-generation from finite-state models is wide. Re-
search in this area can be categorized as follows:
r
Test-generation techniques
r
Empirical studies
r
Test methodology and architectures
In this chapter, we have focused primarily on test-generation tech-
niques. Of the many available techniques, we have described three
techniques—the W-method, UIO-method, and the Wp-method. We
selected these for inclusion due to their intrinsic importance in the
field of FSM-based test-generation and their high fault-detection ef-
fectiveness. Each of these methods has also found its way into test-
generation