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Machine Learning for High-Risk Applications
book

Machine Learning for High-Risk Applications

by Patrick Hall, James Curtis, Parul Pandey
April 2023
Intermediate to advanced
466 pages
14h 40m
English
O'Reilly Media, Inc.
Content preview from Machine Learning for High-Risk Applications

About the Authors

Patrick Hall is principal scientist at BNH.AI, where he advises Fortune 500 companies and cutting-edge startups on AI risk and conducts research in support of NIST’s AI Risk Management Framework. He also serves as visiting faculty in the Department of Decision Sciences at the George Washington School of Business, teaching data ethics, business analytics, and machine learning classes.

Before cofounding BNH, Patrick led H2O.ai’s efforts in responsible AI, resulting in one of the world’s first commercial applications for explainability and bias mitigation in machine learning. He also held global customer-facing roles and R&D research roles at SAS Institute. Patrick studied computational chemistry at the University of Illinois before graduating from the Institute for Advanced Analytics at North Carolina State University.

Patrick has been invited to speak on topics relating to explainable AI at the National Academies of Science, Engineering, and Medicine, ACM SIG-KDD, and the Joint Statistical Meetings. He has contributed written pieces to outlets like McKinsey.com, O’Reilly Radar, and Thompson Reuters Regulatory Intelligence, and his technical work has been profiled in Fortune, Wired, InfoWorld, TechCrunch, and others.

James Curtis is a quantitative researcher at Solea Energy, where he is focused on using statistical forecasting to further the decarbonization of the US power grid. He previously served as a consultant for financial services organizations, insurers, ...

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Publisher Resources

ISBN: 9781098102425Errata Page