Chapter 37. Defect and Fault Tolerance
André DeHonDepartment of Electrical and Systems EngineeringUniversity of Pennsylvania
As device size F continues to shrink, it approaches the scale of individual atoms and molecules. In 2007, 65-nm integrated circuits are in volume production for processors and field-programmable gate arrays (FPGAs). With atom spacing in a silicon lattice around 0.5 nm, F = 65-nm drawn features are a little more than 100 atoms wide. Key features, such as gate lengths, are effectively half or a third this size. Continued geometric scaling (e.g., reducing the feature size by a factor of 2 every six years) will take us to the realm where feature sizes are measured in single-digit atoms sometime in the next couple of decades. ...
Get Reconfigurable Computing now with the O’Reilly learning platform.
O’Reilly members experience books, live events, courses curated by job role, and more from O’Reilly and nearly 200 top publishers.
