Reliability and Failure of Electronic Materials and Devices, 2nd Edition

S

S-N curves, 531

SAM, See Scanning Acoustic Microscopy

Scaling, 682

See also Devices

impact of, 683t

implications of device, 683–686

Scanning Acoustic Microscopy (SAM), 619–622

Scanning electron microscope (SEM), 611, 630

See also Environmental SEM (E-SEM)

backscattered electrons detection, 632

CL, 632–634

diffraction, 632

E-SEM, 635

electron optical column, 631f

thermal wave imaging, 634–635

Scanning electron microscopy (SEM), 630–635

Scanning light microscopy, 628–629

Scanning tunneling microscope (STM), 629–630

SCC, See Stress corrosion cracking

Schottky

barrier, 126–128, 666–667

contacts, 268

heights, 270

behavior, 60

contacts, 60, 268

defects, 604

diodes, 265

gate contact, 83–84

Screw dislocation, 121–122

Scrubbing, 158

SE, See Secondary electrons

Sea-level cosmic rays, ...