Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

Index

A

Academic proposals for SDD detection 99–101

Activation of fault 11, 148, 162

Active endpoints 79; See also Endpoints

Actual path delay 54

Adaptive test 15–16

Adders 37–38

Aggressor arrival time 104

ALAPTF (as-late-as-possible transition fault) model 24, 50, 74, 99

AND bridging fault 11

AND gate 10, 127

K longest path 37, 41

testability of paths 24, 28

two-pattern tests 15, 16

Area under curve, defect distribution 191–192

Arrival time

cross talk impact on path delay 104, 105, 106

TAA

delay calculation 51–52, 53

test generation 57, 58

As-late-as-possible transition fault (ALAPTF) model 24, 50, 74, 99

ATE (automatic test equipment) 75, 85, 157, 174

ATPG; See Automatic test pattern generation

At-speed testing

faster-than-at-speed test