Test Generation
For this state, we get the following sets:
Oedges[q
3
] ={(3, 4)
a/0
, (3, 4)
b/1
}, NE = 2
Oled[1] ={(1, 2), (2, 3)}, Oled[2] ={(4, 5)}
Opattern[1] = a/0, Opattern[2] = b/1
Oend [1] = q
4
, Oend [2] = q
4
.
As no element of Oled is empty, gen-1-uio concludes that state q
3
has
no UIO of length 1 and returns to gen-uio.
In the event gen-1-uio fails, procedure gen-long-uio is invoked. The
task of gen-long-uio is to check if a UIO(s) of length 2 or more exists.
To do so, it collaborates with its descendant gen-L-uio. An incremen-
tal approach is used where UIOs of increasing length, starting at 2,
are examined until either a UIO is found or one is unlikely to be
found, that is a maximum length pattern has been examined.
To check if there is UIO of length ...