Using JMP Student Edition, Third Edition

432 20 Sample Size and Power Platform Sigma Quality Level

In the Counts per Unit window, enter Alpha and the Baseline Count per Unit. Then enter two of the

remaining fields to see the calculation of the third. The test is for a one-sided (one-tailed) change. Enter

the

Difference to Detect in terms of the Baseline Count per Unit (defects per unit). The computed

sample size is expressed as the number of units, rounded to the next whole number.

As an example, consider a wafer manufacturing process with a target of 4 defects per wafer. You want to

verify that a new process meets that target within a difference of 1 defect per wafer with a significance ...