Book description
A Comprehensive Guide to Physical Layer Test and Measurement of Digital Communication Links
Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works.
Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout.
Coverage includes
Signal integrity from a measurement point of view
Digital waveform analysis using high bandwidth real-time and sampling (equivalent time) oscilloscopes
Bit error ratio measurements for both electrical and optical links
Extensive coverage on the topic of jitter in high-speed networks
State-of-the-art optical sampling techniques for analysis of 100 Gbit/s + signals
Receiver characterization: clock recovery, phase locked loops, jitter tolerance and transfer functions, sensitivity testing, and stressed-waveform receiver testing
Channel and system characterization: TDR/T and frequency domain-based alternatives
Testing and measuring PC architecture communication links: PCIexpress, SATA, and FB DIMM
Table of contents
- Title Page
- Copyright Page
- Dedication Page
- Prentice Hall Modern Semiconductor Design Series
- Contents
- Preface
- About the Authors
- Acknowledgments
- Chapter 1. Fundamentals of Digital Communications Systems
- Chapter 2. Jitter Basics
- Chapter 3. Serial Communication Systems and Modulation Codes
- Chapter 4. Bit Error Ratio Testing
- Chapter 5. BERT Scan Measurements
- Chapter 6. Waveform Analysis—Real-Time Scopes
- Chapter 7. Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope
- Chapter 8. High-Speed Waveform Analysis Using All-Optical Sampling
- Chapter 9. Clock Synthesis, Phase Locked Loops, and Clock Recovery
- Chapter 10. Jitter Tolerance Testing
- Chapter 11. Sensitivity Testing in Optical Digital Communications
- Chapter 12. Stress Tests in High-Speed Serial Links
- Chapter 13. Measurements on Interconnects
- Chapter 14. Frequency Domain Measurements
- Chapter 15. Jitter and Signaling Testing for Chip-to-Chip Link Components and Systems
- Appendix A. Pseudo-Random Binary Sequences
- Appendix B. Passive Elements for Test Setups
- Appendix C. Coaxial Cables and Connectors
- Appendix D. Supplemental Materials for Chapter 3
- Index
- Footnotes
Product information
- Title: Digital Communications Test and Measurement: High-Speed Physical Layer Characterization
- Author(s):
- Release date: December 2007
- Publisher(s): Pearson
- ISBN: 9780132209106
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