needed for the published figures and trust that these will be sufficient for wide-
temperature range abuse.
It is of course a risky approach, and two extra risks are that some parameters may
change much more outside the specified temperature range than they do within it, and
that you may successfully test a sample of manufacturer A’s product, but manufacturer
B’s nominally identical parts behave quite differently. We shall comment on this again
in section 5.2.15.
Package reliability
The second factor is reliability. The reliability of any semiconductor device worsens
with increasing temperature; a temperature rise ...
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