by Nur A. Touba, Shianling Wu, Duncan Walker, Erik H. Volkerink, Charles Stroud, Janusz Rajski, Mehrdad Nourani, Benoit Nadeau-Dostie, Yinghua Min, T.M. Mak, Xiaowei Li, Mike Peng Li, James C.-M. Li, Kuen-Jong Lee, Brion Keller, Rohit Kapur, Wen-Ben Jone, Shi-Yu Huang, Jiun-Lang Huang, Michael S. Hsiao, William Eklow, Kwang-Ting Cheng, Xinghao Chen, Abhijit Chatterjee, Soumendu Bhattacharya, Khader S. Abdel-Hafez, Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
Most up-to-date coverage of design for testability.
Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.