Chapter 5. Logic Built-In Self-Test
Laung-Terng (L.-T.) WangSynTest Technologies, Inc., Sunnyvale, California
About this Chapter
Logic built-in self-test (BIST) is a design for testability (DFT) technique in which a portion of a circuit on a chip, board, or system is used to test the digital logic circuit itself. Logic BIST is crucial for many applications, in particular for life-critical and mission-critical applications. These applications commonly found in the aerospace/defense, automotive, banking, computer, healthcare, networking, and telecommunications industries require on-chip, on-board, or in-system self-test to improve the reliability of the entire system, as well as the ability to perform remote diagnosis.
This chapter first introduces ...
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